{"id":1843,"date":"2023-07-14T15:22:14","date_gmt":"2023-07-14T13:22:14","guid":{"rendered":"https:\/\/prokon-elektronika.pl\/?p=1843"},"modified":"2023-07-14T15:22:14","modified_gmt":"2023-07-14T13:22:14","slug":"unlimited-fib-possibilities-webinar-series-available-on-demand-now","status":"publish","type":"post","link":"https:\/\/prokon-elektronika.pl\/en\/unlimited-fib-possibilities-webinar-series-available-on-demand-now\/","title":{"rendered":"Unlimited FIB possibilities \u2013 Webinar series available on demand now!"},"content":{"rendered":"<p>Ever thought you\u2019d reached the limits of what is possible with your nanofabrication system? Working with <a href=\"https:\/\/raith.com\/product\/velion\/\">a multi-ion-species FIB-SEM<\/a>\u00a0 might be the answer. FIB Product Manager Torsten Richter of Raith company describes the many new possibilities in nanofabrication and <a href=\"https:\/\/raith.com\/ion-microscopy\/\">ion microscopy<\/a>\u00a0 in a <a href=\"https:\/\/raith.com\/webinar-area-login\/\">webinar double feature<\/a> , which is now available on demand.<br \/>\nWATCH WEBINARS NOW<\/p>\n<p>&nbsp;<\/p>\n<p>It\u2019s all about FIB in perfection<br \/>\n<strong>The first webinar<\/strong> of the series of two covers the unique capabilities and setup of the VELION FIB-SEM with top-down FIB on <a href=\"https:\/\/raith.com\/technology\/laser-interferometer-stage\/\">a laser interferometer stage<\/a> and <a href=\"https:\/\/raith.com\/technology\/column-technologies\/multi-species-ion-sources\/\">a multi-species ion source<\/a>\u00a0 Torsten explains the advantages of the unique setup and shows how it can be used to enhance the results in application areas such as:<br \/>\n\u2022 Ion implantation<br \/>\n\u2022 Large-area nanofabrication<br \/>\n\u2022 High-precision milling &amp; wafer scale patterning<br \/>\n\u2022 3D FIB nanofabrication<\/p>\n<p>&nbsp;<\/p>\n<p>Next-generation FIB source GaBiLi<br \/>\n<strong>The second webinar<\/strong> introduces the new GaBiLi ion source for the VELION, which enables high-resolution lithium FIB patterning as well as high-resolution and low-damage ion microscopy. Combining light and heavy ion species in a single source enables these ions to be used in one process without the need for beam offset or settling time. Torsten shows how the new GaBiLi source converts the mature nanofabrication system VELION into a powerful ion microscope, enabling<br \/>\n\u2022 Sub-2 nm image resolution<br \/>\n\u2022 High depth of focus<br \/>\n\u2022 High surface sensitivity<br \/>\n\u2022 3D sample reconstruction<\/p>\n<p>&nbsp;<\/p>\n<p><a href=\"https:\/\/raith.com\/webinar-area-login\/\">WATCH WEBINARS NOW<\/a><\/p>\n<p>Explore unlimited pathways for FIB nanopatterning and ion imaging<br \/>\nThe webinar double feature shows how a FIB with multiple ion species opens up new opportunities of what is possible in nanofabrication as well as in FIB imaging. <a href=\"https:\/\/raith.com\/register\/\">Register as a user\u00a0<\/a> on Raith website and watch the webinars now to discover the possibilities that arise from working with a top-down FIB emitting various ion species from a single source.<br \/>\nBy becoming a registered user, you will also have access to the vast material of available <a href=\"https:\/\/raith.com\/downloads\/\">downloads<\/a> , such as <a href=\"https:\/\/raith.com\/ion-microscopy-whitepaper\/\">Raith White Papers<\/a> on FIB-SEM nanofabrication\u00a0 and <a href=\"https:\/\/raith.com\/ion-microscopy\/\">ion microscopy<\/a>.<\/p>\n<p>&nbsp;<\/p>\n<p><a href=\"https:\/\/raith.com\/register\/\">REGISTER TO GET ACCESS TO WEBINARS AND MUCH MORE<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Ever thought you\u2019d reached the limits of what is possible with your nanofabrication system? Working with a multi-ion-species FIB-SEM\u00a0 might be the answer. FIB Product&#8230;<\/p>\n","protected":false},"author":3,"featured_media":823,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[123],"tags":[],"class_list":["post-1843","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-news"],"_links":{"self":[{"href":"https:\/\/prokon-elektronika.pl\/en\/wp-json\/wp\/v2\/posts\/1843","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/prokon-elektronika.pl\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/prokon-elektronika.pl\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/prokon-elektronika.pl\/en\/wp-json\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/prokon-elektronika.pl\/en\/wp-json\/wp\/v2\/comments?post=1843"}],"version-history":[{"count":1,"href":"https:\/\/prokon-elektronika.pl\/en\/wp-json\/wp\/v2\/posts\/1843\/revisions"}],"predecessor-version":[{"id":1844,"href":"https:\/\/prokon-elektronika.pl\/en\/wp-json\/wp\/v2\/posts\/1843\/revisions\/1844"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/prokon-elektronika.pl\/en\/wp-json\/wp\/v2\/media\/823"}],"wp:attachment":[{"href":"https:\/\/prokon-elektronika.pl\/en\/wp-json\/wp\/v2\/media?parent=1843"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/prokon-elektronika.pl\/en\/wp-json\/wp\/v2\/categories?post=1843"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/prokon-elektronika.pl\/en\/wp-json\/wp\/v2\/tags?post=1843"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}