{"id":949,"date":"2021-03-11T14:41:46","date_gmt":"2021-03-11T13:41:46","guid":{"rendered":"http:\/\/prokon-elektronika.pl\/katalog\/uncategorized\/nps-nano-point-scanner-skaner-nano-punktowy\/"},"modified":"2021-03-23T15:11:03","modified_gmt":"2021-03-23T14:11:03","slug":"nps-nano-point-scanner","status":"publish","type":"product","link":"https:\/\/prokon-elektronika.pl\/en\/katalog\/confocal-systems\/nps-nano-point-scanner\/","title":{"rendered":"NPS (Nano Point Scanner)"},"content":{"rendered":"<p><span style=\"font-weight: 400;\">The NPS is an innovative non-contact confocal 3D profilometer measuring altitude in real time, for profile or surface scanning:<\/span><\/p>\n<ol>\n<li style=\"font-weight: 400;\" aria-level=\"1\"><span style=\"font-weight: 400;\">The white light LED beam is projected through a beamsplitter<\/span><span style=\"font-weight: 400;\"><br \/>\n<\/span><span style=\"font-weight: 400;\">and a chromatic lens to the surface of the sample<\/span><\/li>\n<li style=\"font-weight: 400;\" aria-level=\"1\"><span style=\"font-weight: 400;\">The reflected light beam from the sample is filtered in a<\/span><span style=\"font-weight: 400;\"><br \/>\n<\/span><span style=\"font-weight: 400;\">confocal pinhole, isolating one single wavelength in perfect focus<\/span><\/li>\n<li style=\"font-weight: 400;\" aria-level=\"1\"><span style=\"font-weight: 400;\">The NPS spectrometer is accurately translating this wavelength<\/span><span style=\"font-weight: 400;\"><br \/>\n<\/span><span style=\"font-weight: 400;\">into height information and display it visually in the NPS software<\/span><\/li>\n<li style=\"font-weight: 400;\" aria-level=\"1\"><span style=\"font-weight: 400;\">Up to 2000 height information per second are acquired in<\/span><span style=\"font-weight: 400;\"><br \/>\n<\/span><span style=\"font-weight: 400;\">real time creating a profile when moving the XY stage<\/span><\/li>\n<\/ol>\n<p><span style=\"font-weight: 400;\">You can select between two modes: Profile or Surface<\/span><\/p>\n<p><span style=\"font-weight: 400;\">&#8211; X movement gives a profile<\/span><\/p>\n<p><span style=\"font-weight: 400;\">&#8211; XY movement gives 3D<\/span><\/p>\n<p><span style=\"font-weight: 400;\">You do not need to move the Z axis.<\/span><\/p>\n<p><span style=\"font-weight: 400;\">The confocal system generates a sharply focused observation plane. Points located above or below the object surface are completely out of focus, so that the type of material does not matter: the sample can be mirror, shinny, reflective or rough, it can be opaque or completely transparent.<\/span><\/p>\n<p><span style=\"font-weight: 400;\">NPS can be attached to the HIROX microscope system or be used independently.<\/span><\/p>\n","protected":false},"excerpt":{"rendered":"<p><span style=\"font-weight: 400;\">The NPS is an innovative non-contact confocal 3D profilometer measuring altitude in real time, for profile or surface scanning<\/span><\/p>\n","protected":false},"featured_media":570,"template":"","meta":[],"class_list":["post-949","product","type-product","status-publish","has-post-thumbnail","hentry","product_cat-confocal-systems","product_tag-material-engineering","product_tag-microassembly","product_tag-nanotechnology","product_tag-optical-inspection-3d-measurements-scanning","product_tag-photovoltaics","product_tag-printed-electronics","product_tag-semiconductor-electronics","product_tag-thick-film-hybrids-and-ltcc","pa_producent-hirox-en"],"_links":{"self":[{"href":"https:\/\/prokon-elektronika.pl\/en\/wp-json\/wp\/v2\/product\/949","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/prokon-elektronika.pl\/en\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/prokon-elektronika.pl\/en\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/prokon-elektronika.pl\/en\/wp-json\/wp\/v2\/media\/570"}],"wp:attachment":[{"href":"https:\/\/prokon-elektronika.pl\/en\/wp-json\/wp\/v2\/media?parent=949"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}