New, revolutionary IONMASTER (FIB SIMS tool) from Raith provides incredible capabilities in elemental analysis.

IONMASTER is a powerful ion microscope for 3D imaging and SIMS nanoanalytics. This groundbreaking instrument is designed to redefine the boundaries of advanced material characterization.

IONMASTER enables access to novel applications combining unmatched resolution and sensitivity with shortest time-to-result.
Equipped with a magnetic sector SIMS unit and a focal plane detector it allows to detect all masses in parallel while the multi species ion source provides application specific primary ions. All this combined with a laser interferometer stage IONMASTER uniquely offers correlative high-resolution 2D/3D imaging, nano-analytics, and sophisticated nanofabrication in one tool! Through this unique set-up it delivers detailed insights into almost any kind of sample easily and quickly.

More information on: https://raith.com/products/ionmaster/