Description:

The NPS is an innovative non-contact confocal 3D profilometer measuring altitude in real time, for profile or surface scanning:

1. The white light LED beam is projected through a beamsplitter
   and a chromatic lens to the surface of the sample
2. The reflected light beam from the sample is filtered in a
   confocal pinhole, isolating one single wavelength in perfect focus
3. The NPS spectrometer is accurately translating this wavelength
   into height information and display it visually in the NPS software
4. Up to 2000 height information per second are acquired in
   real time creating a profile when moving the XY stage

You can select between two modes: Profile or Surface

– X movement gives a profile

– XY movement gives 3D

You do not need to move the Z axis.

The confocal system generates a sharply focused observation plane. Points located above or below the object surface are completely out of focus, so that the type of material does not matter: the sample can be mirror, shinny, reflective or rough, it can be opaque or completely transparent.

NPS can be attached to the HIROX microscope system or be used independently.